![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Electronic Imaging 2008 - San Jose, CA (Sunday 27 January 2008)] Image Quality and System Performance V - Characterization of reflection scanner uniformity
Farnand, Susan P., Zeise, Eric K., Kress, William C., Gaykema, Frans, Williams, Donald R.Volume:
6808
Year:
2008
Language:
english
DOI:
10.1117/12.772618
File:
PDF, 726 KB
english, 2008