SPIE Proceedings [SPIE Photonics Europe - Strasbourg,...

  • Main
  • SPIE Proceedings [SPIE Photonics Europe...

SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 7 April 2008)] Optical Micro- and Nanometrology in Microsystems Technology II - Adaptive measurement of deformation and shape by compensation using TV holography and digital holography

Kornis, János, Gorecki, Christophe, Asundi, Anand K., Béki, Bence, Séfel, Richárd, Osten, Wolfgang
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
6995
Year:
2008
Language:
english
DOI:
10.1117/12.782182
File:
PDF, 1.05 MB
english, 2008
Conversion to is in progress
Conversion to is failed