SPIE Proceedings [SPIE 3rd International Symposium on...

SPIE Proceedings [SPIE 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Chengdu, China (Sunday 8 July 2007)] 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Influence of ambient gas on the microstructural properties of Er-doped nanocrystalline Si film fabricated by pulsed laser ablation

Zhou, Yang, Yang, Li, Chen, Yaolong, Chu, Lizhi, Duan, Pingguang, Kley, Ernst-Bernhard, Li, Rongbin, Xu, Wei, Wang, Yinglong, F, Guangsheng

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Volume:

6722

Year:

2007

Language:

english

DOI:

10.1117/12.783391

File:

PDF, 844 KB

english, 2007

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