SPIE Proceedings [SPIE Ninth International Symposium on Laser Metrology - Unknown, Singapore (Monday 30 June 2008)] Ninth International Symposium on Laser Metrology - Study on a new method for measuring volumetric error of CMM
Shi, Enxiu, Quan, Chenggen, Asundi, Anand, Guo, Junjie, Huang, YumeiVolume:
7155
Year:
2008
Language:
english
DOI:
10.1117/12.814553
File:
PDF, 225 KB
english, 2008