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SPIE Proceedings [SPIE International Symposium on Photoelectronic Detection and Imaging 2009 - Beijing, China (Wednesday 17 June 2009)] International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Imaging Detectors and Applications - Camera calibration method for dimensional measurement of heavy forging in large scale
Liu, Bin, Zhang, Kun, Wang, Xiang-jun, Hu, Chunhai, Song, Xiaoxue, Zhang, Guang-jun, Ai, Ke-cong, Zhao, ZhenqingVolume:
7384
Year:
2009
Language:
english
DOI:
10.1117/12.834818
File:
PDF, 455 KB
english, 2009