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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 1 August 2010)] Infrared Remote Sensing and Instrumentation XVIII - Single photon emission and detection at the nanoscale utilizing semiconductor nanowires
Reimer, Michael E., Strojnik, Marija, Paez, Gonzalo, van Kouwen, Maarten P., Barkelid, Maria, Hocevar, Moïra, van Weert, Maarten H. M., Algra, Rienk E., Bakkers, Erik P. A. M., Björk, Mikael T., SchmiVolume:
7808
Year:
2010
Language:
english
DOI:
10.1117/12.868961
File:
PDF, 3.20 MB
english, 2010