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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 21 August 2011)] Solar Physics and Space Weather Instrumentation IV - Solar EUV Monitor (SEM) absolute irradiance measurements and how they are affected by choice of reference spectrum
Wieman, Seth R., Fineschi, Silvano, Fennelly, Judy, Judge, Darrell L., Didkovsky, Leonid V.Volume:
8148
Year:
2011
Language:
english
DOI:
10.1117/12.893163
File:
PDF, 383 KB
english, 2011