SPIE Proceedings [SPIE International Symposium on Photoelectronic Detection and Imaging 2011 - Beijing, China (Tuesday 24 May 2011)] International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications - Gain and noise analysis of an intensified EMCCD
Xi, Xiaoqi, Zhao, Junyu, Zang, Qing, Han, Xiaofeng, Dai, Xingxing, Yang, Jianhua, Zhang, Lili, Li, MengtingVolume:
8194
Year:
2012
Language:
english
DOI:
10.1117/12.900801
File:
PDF, 265 KB
english, 2012