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SPIE Proceedings [SPIE Laser and Opto-Electronic Technology in Industry: State of the Art Review - Xiamen, China (Wednesday 25 June 1986)] Laser and Opto-Electronic Technology in Industry: State-of-the-Art Review - Optoelectronic Techniques For Measurement And Inspection
Baker, Lionel R., Ke, Jingtang, Pryputniewicz, Ryszard J.Volume:
699
Year:
1987
Language:
english
DOI:
10.1117/12.936906
File:
PDF, 188 KB
english, 1987