SPIE Proceedings [SPIE 17th Int'l Conference on High Speed Photography and Photonics - Pretoria, South Africa (Monday 1 September 1986)] 17th Intl Congress on High Speed Photography and Photonics - Using Photo Voltaic Diodes To Measure The Deformation Response Of A Structure Subjected To An Explosive Load
Nurick, G. N., Hollingworth, Donald, McDowell, Maurice W.Volume:
674
Year:
1987
Language:
english
DOI:
10.1117/12.975555
File:
PDF, 3.24 MB
english, 1987