SPIE Proceedings [SPIE Photonics Asia - Beijing, China (Monday 5 November 2012)] Optical Metrology and Inspection for Industrial Applications II - Holographic approach to detection of delamination areas in layered polymeric waveguides by means of strain solitons
Semenova, Irina V., Dreiden, Galina V., Khusnutdinova, Karima R., Samsonov, Alexander M., Harding, Kevin G., Huang, Peisen S., Yoshizawa, ToruVolume:
8563
Year:
2012
Language:
english
DOI:
10.1117/12.999709
File:
PDF, 2.45 MB
english, 2012