Choosing the ranges for measuring the reflectivity of a prism coupler in the waveguide spectroscopy of thin films
Sotsky, A. B., Steingart, L. M., Parashkov, S. O., Sotskaya, L. I.Volume:
80
Language:
english
Journal:
Bulletin of the Russian Academy of Sciences: Physics
DOI:
10.3103/S1062873816040304
Date:
April, 2016
File:
PDF, 432 KB
english, 2016