Processing, basic characterization and standard dielectric...

Ferroelectrics 2016 / 07 Vol. 499; Iss. 1

Processing, basic characterization and standard dielectric measurements on PLZT x/65/35 (2≤x≤13) ceramics

Pytel, Krzysztof, Suchanicz, Jan, Livinsh, Maris, Sternberg, Andris
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Volume:
499
Language:
english
Journal:
Ferroelectrics
DOI:
10.1080/00150193.2016.1171644
Date:
July, 2016
File:
PDF, 1.77 MB
english, 2016
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