SPIE Proceedings [SPIE International Symposium on Optical Fabrication, Testing, and Surface Evaluation - Tokyo, Japan (Wednesday 10 June 1992)] Intl Symp on Optical Fabrication, Testing, and Surface Evaluation - HOE interferometer for cylindrical surface
Minami, Yoshitaka, Yasuda, Kenji, Tsujiuchi, JumpeiVolume:
1720
Year:
1992
Language:
english
DOI:
10.1117/12.132180
File:
PDF, 411 KB
english, 1992