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SPIE Proceedings [SPIE Microelectronic Processing '92 - San Jose, CA (Sunday 20 September 1992)] Microelectronics Manufacturing and Reliability - Implications of scaling on static RAM bit cell stability and reliability
Coones, Mary Ann, Herr, Norm, Bormann, Al, Erington, Kent, Soorholtz, Vince, Sweeney, John, Phillips, Michael, Vasquez, Barbara, Sabnis, Anant G., MacWilliams, Kenneth P., Woo, Jason C.Volume:
1802
Year:
1993
Language:
english
DOI:
10.1117/12.139349
File:
PDF, 460 KB
english, 1993