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SPIE Proceedings [SPIE Measurement Technology and Intelligent Instruments - Wuhan, China (Friday 29 October 1993)] Measurement Technology and Intelligent Instruments - System design principle of linear CCD applied for measuring parts

Tang, Ling-Jing, Xie, Tuqiang, Zhu, Li
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Volume:
2101
Year:
1993
Language:
english
DOI:
10.1117/12.156412
File:
PDF, 162 KB
english, 1993
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