SPIE Proceedings [SPIE SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 11 July 1993)] Multilayer and Grazing Incidence X-Ray/EUV Optics II - Measurement of multilayer reflectivities from 8 keV to 130 keV
Hoghoj, Peter, Joensen, Karsten D., Christensen, Finn E., Susini, Jean, Ziegler, Eric, Freund, Andreas K., Lueken, E., Riekel, Christian, Hoover, Richard B.Volume:
2011
Year:
1994
Language:
english
DOI:
10.1117/12.167237
File:
PDF, 249 KB
english, 1994