![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE IS&T/SPIE 1994 International Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 6 February 1994)] Machine Vision Applications in Industrial Inspection II - Inspection of ceramic tableware for quality control using a neural network vision system
Finney, Graham B., Gomm, J. B., Williams, D., Atkinson, John T., Dawson, Benjamin M., Wilson, Stephen S., Wu, Frederick Y.Volume:
2183
Year:
1994
Language:
english
DOI:
10.1117/12.171204
File:
PDF, 396 KB
english, 1994