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SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology (OIT2013) - Beijing, China (Sunday 17 November 2013)] 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - High dynamic range image acquisition method for 3D solder paste measurement
Li, Xiaohui, Sun, Changku, Wang, Peng, Xu, Yixin, Tam, Hwa-Yaw, Xu, Kexin, Xiao, Hai, Zhu, Jigui, Zhao, Chun-LiuVolume:
9046
Year:
2013
Language:
english
DOI:
10.1117/12.2036314
File:
PDF, 1.02 MB
english, 2013