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SPIE Proceedings [SPIE San Dieg - DL Tentative - San Diego, CA (Sunday 1 July 1990)] Advanced Optical Manufacturing and Testing - On-machine measurement of roughness, waviness, and flaws
Baker, Lionel R., Sanger, Gregory M., Reid, Paul B., Baker, Lionel R.Volume:
1333
Year:
1990
Language:
english
DOI:
10.1117/12.22809
File:
PDF, 295 KB
english, 1990