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SPIE Proceedings [SPIE Electronic Imaging: Science & Technology - San Jose, CA (Sunday 28 January 1996)] Machine Vision Applications in Industrial Inspection IV - Machine vision inspection of technical ceramics
Patek, David R., Tobin, Jr., Kenneth W., Jachter, L., Rao, A. Ravishankar, Chang, NingVolume:
2665
Year:
1996
Language:
english
DOI:
10.1117/12.232246
File:
PDF, 663 KB
english, 1996