SPIE Proceedings [SPIE SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 4 August 1996)] Imaging Spectrometry II - SFSI: the CCRS SWIR imaging spectrometer
Neville, Robert A., Marois, R., Rowlands, Neil, Powell, Ian P., Descour, Michael R., Mooney, Jonathan M.Volume:
2819
Year:
1996
Language:
english
DOI:
10.1117/12.258084
File:
PDF, 528 KB
english, 1996