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SPIE Proceedings [SPIE Intl. Conf. on Experimental Mechanics: Advances and Applications - Singapore, Singapore (Wednesday 4 December 1996)] International Conference on Experimental Mechanics: Advances and Applications - Defect measurement using structured light system
Toh, Siew-Lok, Low, W. K., Tay, Cho J., Shang, Huai M., Asundi, Anand K., Chau, Fook S., Lim, C. T.Volume:
2921
Year:
1997
Language:
english
DOI:
10.1117/12.269871
File:
PDF, 424 KB
english, 1997