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SPIE Proceedings [SPIE Optical Science, Engineering and Instrumentation '97 - San Diego, CA (Sunday 27 July 1997)] Hard X-Ray and Gamma-Ray Detector Physics, Optics, and Applications - X-ray imaging systems with micron resolution based on Kumakhov optics

Nikitin, Andrey N., Hoover, Richard B., Doty, F. P.
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Volume:
3115
Year:
1997
Language:
english
DOI:
10.1117/12.277673
File:
PDF, 504 KB
english, 1997
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