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SPIE Proceedings [SPIE International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Kiev, Ukraine (Tuesday 13 May 1997)] Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997 - Short-wave emission of Tb3+ as an optical indicator of TFELS matrix changes
Khomchenko, V. S., Rodionov, V. E., Tzirkunov, Yu. A., Svechnikov, Sergey V., Valakh, Mikhail Y.Volume:
3359
Year:
1998
Language:
english
DOI:
10.1117/12.306226
File:
PDF, 309 KB
english, 1998