SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] Bayesian Inference for Inverse Problems - Simultaneous multiple regularization parameter selection by means of the L-hypersurface with applications to linear inverse problems posed in the wavelet transform domain
Belge, Murat, Kilmer, Misha E., Miller, Eric L., Mohammad-Djafari, AliVolume:
3459
Year:
1998
Language:
english
DOI:
10.1117/12.323812
File:
PDF, 1.22 MB
english, 1998