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SPIE Proceedings [SPIE Electronic Imaging - San Jose, CA (Saturday 22 January 2000)] Visual Data Exploration and Analysis VII - Multiresolution wavelet analysis for simplification and visualization of multitextured meshes
Toubin, Marc F., Page, David L., Dumont, Christophe, Truchetet, Frederic, Abidi, Mongi A., Erbacher, Robert F., Chen, Philip C., Roberts, Jonathan C., Wittenbrink, Craig M.Volume:
3960
Year:
2000
Language:
english
DOI:
10.1117/12.378891
File:
PDF, 1.95 MB
english, 2000