![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments - Beijing, China (Wednesday 8 November 2000)] Optical Measurement and Nondestructive Testing: Techniques and Applications - Laser measurement for slight deformation of a large-scale structure
Yi, Yaxing, Li, Zhongke, Li, Xinshe, Deng, Fanglin, Song, FeiJun, Chen, Frank, Hung, Michael Y.Y., Shang, H.M.Volume:
4221
Year:
2000
Language:
english
DOI:
10.1117/12.402629
File:
PDF, 85 KB
english, 2000