SPIE Proceedings [SPIE Photonics West 2001 - Electronic Imaging - San Jose, CA (Saturday 20 January 2001)] Visual Data Exploration and Analysis VIII - Metrics and visualization tools for surface mesh comparison
Zhou, Laixin, Pang, Alex, Erbacher, Robert F., Chen, Philip C., Roberts, Jonathan C., Wittenbrink, Craig M., Grohn, MattiVolume:
4302
Year:
2001
Language:
english
DOI:
10.1117/12.424920
File:
PDF, 453 KB
english, 2001