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SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 29 July 2001)] Subsurface and Surface Sensing Technologies and Applications III - Optical and microwave length measurement for logs
Stelzer, Andreas, Diskus, Christian G., Holzer, Robert, Kolmhofer, Erich, Stadler, Michael, Nguyen, CamVolume:
4491
Year:
2001
Language:
english
DOI:
10.1117/12.450159
File:
PDF, 575 KB
english, 2001