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SPIE Proceedings [SPIE Integrated Optoelectronics Devices - San Jose, CA (Saturday 25 January 2003)] Vertical-Cavity Surface-Emitting Lasers VII - Characterization of failure mechanisms for oxide VCSELs
McHugo, Scott A., Krishnan, A., Krueger, Joachim J., Luo, Yong, Tan, Ningxia, Osentowski, Tim, Xie, Suning, Mayonte, Myrna S., Herrick, Robert W., Deng, Qing, Heidecker, Mike, Eastley, David, Keever,Volume:
4994
Year:
2003
Language:
english
DOI:
10.1117/12.482637
File:
PDF, 355 KB
english, 2003