SPIE Proceedings [SPIE Electronic Imaging 2003 - Santa Clara, CA (Monday 20 January 2003)] Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications IV - PSF measurements on back-illuminated CCDs
Widenhorn, Ralf, Weber, Alexander, Blouke, Morley M., Bae, Albert J., Bodegom, Erik, Blouke, Morley M., Sampat, Nitin, Motta, Ricardo J.Volume:
5017
Year:
2003
Language:
english
DOI:
10.1117/12.482797
File:
PDF, 727 KB
english, 2003