SPIE Proceedings [SPIE Fifth International Symposium on Instrumentation and Control Technology - Beijing, China (Friday 24 October 2003)] Fifth International Symposium on Instrumentation and Control Technology - Combining blur and affine moment invariants in object recognition
Li, Yingchun, Chen, Hexin, Zhang, Jiujun, Qu, Pengfei, Zhang, Guangjun, Zhao, Huijie, Wang, ZhongyuVolume:
5253
Year:
2003
Language:
english
DOI:
10.1117/12.521525
File:
PDF, 258 KB
english, 2003