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SPIE Proceedings [SPIE Integrated Optoelectronic Devices 2004 - San Jose, CA, United States (Monday 26 January 2004)] Optical Components and Materials - Cylinder-assisted Maker-fringe technique to probe second-order nonlinearity profiles
Ozcan, Aydogan, Digonnet, Michel J. F., Kino, Gordon S.Volume:
5350
Year:
2004
Language:
english
DOI:
10.1117/12.532114
File:
PDF, 428 KB
english, 2004