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SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Developments in X-Ray Tomography IV - Microstructural characterization in 3D: the key to understanding grain growth in polycrystalline materials?
Krill III, Carl E., Dobrich, Kristian M., Ziehmer, Markus, Rau, Christoph, Bonse, UlrichVolume:
5535
Year:
2004
Language:
english
DOI:
10.1117/12.559827
File:
PDF, 1.30 MB
english, 2004