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SPIE Proceedings [SPIE OE/LASE '92 - Los Angeles, CA (Sunday 19 January 1992)] Scanning Probe Microscopies - Nanofabrication utilizing the atomic-force microscope
Nagahara, L. A., Oden, Patrick I., Majumdar, Arun, Carrejo, J. P., Graham, J., Alexander, John, Manne, SrinivasVolume:
1639
Year:
1992
Language:
english
DOI:
10.1117/12.58184
File:
PDF, 589 KB
english, 1992