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SPIE Proceedings [SPIE Nondestructive Evaulation for Health Monitoring and Diagnostics - San Diego, CA (Sunday 6 March 2005)] Testing, Reliability, and Application of Micro- and Nano-Material Systems III - X-ray diffraction topography image materials by molecular probe
Hentschel, Manfred P., Geer, Robert E., Meyendorf, Norbert, Lange, Axel, Schors, Joerg, Baaklini, George Y., Michel, Bernd, Wald, OliverVolume:
5766
Year:
2005
Language:
english
DOI:
10.1117/12.601886
File:
PDF, 516 KB
english, 2005