![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Optical Measurement Systems for Industrial Inspection IV - Improving 3D surface measurement accuracy on metallic surfaces
Kokku, Raghu, Osten, Wolfgang, Gorecki, Christophe, Brooksby, Glen, Novak, Erik L.Volume:
5856
Year:
2005
Language:
english
DOI:
10.1117/12.612243
File:
PDF, 144 KB
english, 2005