SPIE Proceedings [SPIE Optical Metrology - Munich, Germany...

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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Optical Methods for Arts and Archaeology - Tools for inverse mapping and visualization of multi-spectral image data on 3D scanned representations of drawings

Callieri, M., Salimbeni, Renzo, Pezzati, Luca, Cignoni, P., Ganovelli, F., Pingi, P., Ponchio, F., Montani, C., Scopigno, R.
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Volume:
5857
Year:
2005
Language:
english
DOI:
10.1117/12.617733
File:
PDF, 1.31 MB
english, 2005
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