SPIE Proceedings [SPIE SPIE Proceedings - (Sunday 12 February 2012)] - Optical full-field technique for measuring deformation on micromechanical components
Li, Xide, Wei, Cheng, Lopez, Jose F., Quan, Chenggen, Chau, Fook Siong, Fernandez, Francisco V., Lopez-Villegas, Jose Maria, Asundi, Anand, Wong, Brian Stephen, de la Rosa, Jose M., Lim, Chwee TeckYear:
2012
Language:
english
DOI:
10.1117/12.621982
File:
PDF, 1.86 MB
english, 2012