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SPIE Proceedings [SPIE Optics East 2006 - Boston, MA (Sunday 1 October 2006)] Two- and Three-Dimensional Methods for Inspection and Metrology IV - Optical crack following on tunnel surfaces
Paar, Gerhard, Huang, Peisen S., Caballo-Perucha, Maria d. P., Kontrus, Heiner, Sidla, OliverVolume:
6382
Year:
2006
Language:
english
DOI:
10.1117/12.685987
File:
PDF, 685 KB
english, 2006