SPIE Proceedings [SPIE Microtechnologies for the New Millennium - Maspalomas, Gran Canaria, Spain (Wednesday 2 May 2007)] VLSI Circuits and Systems III - A methodology for switching noise estimation at gate level
Castro, Javier, Parra, Pilar, Acosta, Antonio J., de Armas Sosa, Valentín, Eshraghian, Kamran, Tobajas, Félix B.Volume:
6590
Year:
2007
Language:
english
DOI:
10.1117/12.724164
File:
PDF, 197 KB
english, 2007