SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 18 June 2007)] Optical Measurement Systems for Industrial Inspection V - S-transform analysis of projected fringe patterns
Kocahan, Özlem, Özder, Serhat, Coşkun, Emre, Osten, Wolfgang, Gorecki, Christophe, Novak, Erik L.Volume:
6616
Year:
2007
Language:
english
DOI:
10.1117/12.725786
File:
PDF, 380 KB
english, 2007