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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 18 June 2007)] Optical Measurement Systems for Industrial Inspection V - Quantification of defect size in shearing direction by shearography and wavelet transform
Michel, Fabrice, Moreau, Vincent, Rosso, Vanessa, Habraken, Serge, Tilkens, Bernard, Osten, Wolfgang, Gorecki, Christophe, Novak, Erik L.Volume:
6616
Year:
2007
Language:
english
DOI:
10.1117/12.725997
File:
PDF, 1.02 MB
english, 2007