SPIE Proceedings [SPIE SPIE NanoScience + Engineering - San Diego, CA (Sunday 2 August 2009)] Instrumentation, Metrology, and Standards for Nanomanufacturing III - Detecting molecular stress in metals
Hernandez-Gomez, Eduardo, Postek, Michael T., Allgair, John A., Suarez-Romero, J. G., Hurtado-Ramos, Juan B.Volume:
7405
Year:
2009
Language:
english
DOI:
10.1117/12.827005
File:
PDF, 309 KB
english, 2009