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SPIE Proceedings [SPIE International Symposium on Photoelectronic Detection and Imaging 2009 - Beijing, China (Wednesday 17 June 2009)] International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Infrared Imaging and Applications - A real-time testing system for infrared imaging system
Hu, Ruo-lan, Puschell, Jeffery, Gong, Hai-mei, Mou, Xin-gang, Pan, Xiao-dong, Cai, Yi, Lu, Jin, Zhang, Gui-lin, Fei, Jin-dongVolume:
7383
Year:
2009
Language:
english
DOI:
10.1117/12.835523
File:
PDF, 1.09 MB
english, 2009