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SPIE Proceedings [SPIE International Conference on Optical Instrumentation and Technology - Shanghai, China (Monday 19 October 2009)] 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - Research of full-field deformation measurement system
Yue, Kaiduan, Ye, Shenghua, Zhang, Guangjun, Yuan, Mei, Yi, Yaxing, Ni, Jun, Li, Zhongke, Zhang, Fei, Jian, LongfeiVolume:
7511
Year:
2009
Language:
english
DOI:
10.1117/12.837776
File:
PDF, 3.77 MB
english, 2009