![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Francisco Airport, California, USA (Sunday 23 January 2011)] Image Processing: Algorithms and Systems IX - Analysing wear in carpets by detecting varying local binary patterns
Orjuela, S. A., Astola, Jaakko T., Egiazarian, Karen O., Vansteenkiste, E., Rooms, F., De Meulemeester, S., De Keyser, R., Philips, W.Volume:
7870
Year:
2011
Language:
english
DOI:
10.1117/12.871988
File:
PDF, 2.60 MB
english, 2011