SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Monday 23 May 2011)] Optical Measurement Systems for Industrial Inspection VII - The effect of misalignment in phase retrieval based on a spatial light modulator
Agour, Mostafa, Lehmann, Peter H., Osten, Wolfgang, Falldorf, Claas, von Kopylow, Christoph, Gastinger, Kay, Bergmann, Ralf B.Volume:
8082
Year:
2011
Language:
english
DOI:
10.1117/12.889200
File:
PDF, 2.89 MB
english, 2011