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SPIE Proceedings [SPIE SPIE Optical Systems Design - Marseille, France (Monday 5 September 2011)] Optical Fabrication, Testing, and Metrology IV - Metrology for an imaging Fourier transform spectrometer working in the far-UV (IFTSUV)
Ruiz de Galarreta Fanjul, C., Duparré, Angela, Geyl, Roland, Philippon, A., Vial, J.-C., Maillard, J.-P., Appourchaux, T.Volume:
8169
Year:
2011
Language:
english
DOI:
10.1117/12.896714
File:
PDF, 1.59 MB
english, 2011